MATEC Web of Conferences
Volume 42, 20162015 The 3rd International Conference on Control, Mechatronics and Automation (ICCMA 2015)
|Number of page(s)||4|
|Section||Electronic application technologies|
|Published online||17 February 2016|
Robust Sequential Circuits Design Technique for Low Voltage and High Noise Scenarios
1 Universidad Autónoma de Tlaxcala, Apizaco ; Tlaxcala, Mexico
2 Universidad Nacional Autónoma de México, Ciudad de Mexico, Mexico
3 Universitat Politecnica de Catalunya, Barcelona, Spain
a Corresponding author: firstname.lastname@example.org
All electronic processing components in future deep nanotechnologies will exhibit high noise level and/or low S/N ratios because of the extreme voltage reduction and the nearly erratic nature of such devices. Systems implemented with these devices would exhibit a high probability to fail, causing an unacceptably reduced reliability.
In this paper we introduce an innovative input and output data redundancy principle for sequential block circuits, the responsible to keep the state of the system, showing its efficiency in front of other robust technique approaches. The methodology is totally different from the Von Neumann approaches, because element are not replicated N times, but instead, they check the coherence of redundant input data no allowing data propagation in case of discrepancy. This mechanism does not require voting devices.
© Owned by the authors, published by EDP Sciences, 2016
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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