MATEC Web of Conferences
Volume 57, 20164th International Conference on Advancements in Engineering & Technology (ICAET-2016)
|Number of page(s)||4|
|Section||Electronic & Electrical Engineering|
|Published online||11 May 2016|
A P-N Sequence Generator Using LFSR with Dual Edge Trigger Technique
1 M. Tech Student, School of Electronics Engineering, Lovely Professional University, Phagwara, Punjab
2 Assistant Professor, School of Electronics Engieering, Lovely Professional University, Phagwara, Punjab
Corresponding author: firstname.lastname@example.org
This paper represents the design and implementation of a low power 4-bit LFSR using Dual edge triggered flip flop. A linear feedback shift register (LFSR) is assembled by N number of flip flops connected in series and a combinational logic generally xor gate. An LFSR can generate random number sequence which acts as cipher in cryptography. A known text encrypted over long PN sequence, in order to improve security sequence made longer ie 128 bit; require long chain of flip flop leads to more power consumption. In this paper a novel circuit of random sequence generator using dual edge triggered flip flop has been proposed. Data has been generated on every edge of flip flop instead of single edge. A DETFF-LFSR can generate random number require with less number of clock cycle, it minimizes the number of flip flop result in power saving. In this paper we concentrates on the designing of power competent Test Pattern Generator (TPG) using four dual edge triggered flip-flops as the basic building block, overall there is reduction of power around 25% by using these techniques.
© Owned by the authors, published by EDP Sciences, 2016
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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