Functional and Parametrical Control of Temperature Sensors with the NI MyRIO Module

Kirill Moskalenko; Kuandyk Omar; Pavel Nekrasov; Andrey Karakozov; Dmitry Boychenko

doi:10.1051/matecconf/20167901020

All issues

Volume 79 (2016)

MATEC Web Conf., 79 (2016) 01020

References

Open Access

Issue		MATEC Web Conf. Volume 79, 2016 VII Scientific Conference with International Participation “Information-Measuring Equipment and Technologies” (IME&T 2016)


Article Number		01020
Number of page(s)		8
DOI		https://doi.org/10.1051/matecconf/20167901020
Published online		11 October 2016

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I.I. Shvetsov-Shilovskiy, P.V. Nekrasov, A. V. Ulanova, A. A. Smolin, A. V. Sogoyan, 2015 International Siberian Conference on Control and Communications (SIBCON 2015), 7147282 (2015) doi: 10.1109/SIBCON.2015.7147282 [Google Scholar]
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NI myRIO-1900 user guide and specifications URL: http://www.ni.com/pdf/manuals/376047a.pdf [Google Scholar]
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D. V. Bobrovskii, O. A. Kalashnikov, P. V. Nekrasov, Russian Microelectronics 41, 226 (2012) doi: 10.1134/S1063739712040038 [CrossRef] [Google Scholar]

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[1] B. Karakozov, O. V. Korneev, P. V. Nekrasov, M. N. Sokolov, D. A. Zagryadsky, Proceedings of the European Conference on Radiation and its Effects on Components and Systems (RADECS), 6937407 (2013) doi: 10.1109/RADECS.2013.6937407 [Google Scholar]

[2] G. I. Zebrev, D. Y. Pavlov, V. S. Pershenkov, A.Y. Nikiforov, A. V. Sogoyan, D.V. Boychenko, V. N. Ulimov, V. V. Emelyanov, IEEE Transactions on Nuclear Science 53, 1981 (2006) doi: 10.1109/TNS.2006.877851 [CrossRef] [Google Scholar]

[3] G. V. Chukov, V.V. Elesin, G.N. Nazarova, A.Y. Nikiforov, D.V. Boychenko, V. A. Telets, A. G. Kuznetsov, K.M. Amburkin, IEEE Radiation Effects Data Workshop, 7004589 (2015) doi: 10.1109/REDW.2014.7004589 [Google Scholar]

[4] O. A. Kalashnikov, V.V. Elesin, D.V. Gromov, 2014 24th International Crimean Conference Microwave and Telecommunication Technology Conference Proceedings (CriMiCo 2014), 6959666 (2014) doi: 10.1109/CRMICO.2014.6959666 [Google Scholar]

[5] P. K. Skorobogatov, K. A. Epifantsev, O. A. Gerasimchuk, Russian Microelectronics 44, 40 (2015) doi: 10.1134/S1063739715010059 [CrossRef] [Google Scholar]

[6] P. K. Skorobogatov, A.Y. Nikiforov, O. B. Mavritsky, A. N. Egorov, A. V. Kirgizova, European Space Agency, (Special Publication) ESA SP (536), BP4 (2004) [Google Scholar]

[7] A. V. Grebenkina, D.V. Boychenko, A.Y. Nikiforov, V. A. Telets, V. V. Amelichev, V.A. Kharitonov, Proceedings of the International Conference on Microelectronics (ICM), 6842103 (2014) doi: 10.1109/MIEL.2014.6842103 [Google Scholar]

[8] G. G. Davydov, A. S. Kolosova, L. N. Kessarinskiy, D.V. Boychenko, 2015 International Siberian Conference on Control and Communications (SIBCON 2015), 7147094 (2015) doi: 10.1109/SIBCON.2015.7147094 [Google Scholar]

[9] N. E. Aristova, A. Y. Borisov, A. I. Tararaksin, L. N. Kessarinskiy, A. V. Yanenko, 2015 International Siberian Conference on Control and Communications (SIBCON 2015), 7146984 (2015) doi: 10.1109/SIBCON.2015.7146984 [Google Scholar]

[10] I. O. Loskutov, A. B. Karakozov, P.V. Nekrasov, A.Y. Nikiforov, 2015 International Siberian Conference on Control and Communications (SIBCON 2015), 7147128 (2015) doi: 10.1109/SIBCON.2015.7147128 [Google Scholar]

[11] I.I. Shvetsov-Shilovskiy, P.V. Nekrasov, A. V. Ulanova, A. A. Smolin, A. V. Sogoyan, 2015 International Siberian Conference on Control and Communications (SIBCON 2015), 7147282 (2015) doi: 10.1109/SIBCON.2015.7147282 [Google Scholar]

[12] DS1624 Digital Thermometer and Memory Data Sheet URL: http://www.mouser.com/ds/2/256/DS1624-27266.pdf [Google Scholar]

[13] NI myRIO-1900 user guide and specifications URL: http://www.ni.com/pdf/manuals/376047a.pdf [Google Scholar]

[14] V.A. Marfin, P.V. Nekrasov, O. A. Kalashnikov, K. A. Kagirina, 2015 International Siberian Conference on Control and Communications (SIBCON 2015), 7147142 (2015) [Google Scholar]

[15] D. V. Bobrovskii, O. A. Kalashnikov, P. V. Nekrasov, Russian Microelectronics 41, 226 (2012) doi: 10.1134/S1063739712040038 [CrossRef] [Google Scholar]