MATEC Web Conf.
Volume 79, 2016VII Scientific Conference with International Participation “Information-Measuring Equipment and Technologies” (IME&T 2016)
|Number of page(s)||6|
|Published online||11 October 2016|
Testing System for Analog Devices Direct Digital Synthesizer
National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), 115409, Moscow, Russia
* Corresponding author: firstname.lastname@example.org
The paper is devoted to the setup for controlling and testing of Direct Digital Synthesizer (DDS) Integrated Circuits (ICs). Control and measurement setup is designed on the basis of National Instruments module equipment PXI-4110, PXI-7841R and LabVIEW development environment. Block diagram of the developed system and software structure are depicted as well as test results for several ICs.
© The Authors, published by EDP Sciences, 2016
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.