| Issue |
MATEC Web Conf.
Volume 79, 2016
VII Scientific Conference with International Participation “Information-Measuring Equipment and Technologies” (IME&T 2016)
|
|
|---|---|---|
| Article Number | 01015 | |
| Number of page(s) | 6 | |
| DOI | https://doi.org/10.1051/matecconf/20167901015 | |
| Published online | 11 October 2016 | |
Testing System for Analog Devices Direct Digital Synthesizer
National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), 115409, Moscow, Russia
* Corresponding author: iolos@spels.ru
The paper is devoted to the setup for controlling and testing of Direct Digital Synthesizer (DDS) Integrated Circuits (ICs). Control and measurement setup is designed on the basis of National Instruments module equipment PXI-4110, PXI-7841R and LabVIEW development environment. Block diagram of the developed system and software structure are depicted as well as test results for several ICs.
© The Authors, published by EDP Sciences, 2016
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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