MATEC Web Conf.
Volume 79, 2016VII Scientific Conference with International Participation “Information-Measuring Equipment and Technologies” (IME&T 2016)
|Number of page(s)||6|
|Published online||11 October 2016|
Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XX
National Research Nuclear University MEPhI, 115409, Moscow, Russia
* Corresponding author: firstname.lastname@example.org
The article presents the hardware-software complex for functional and parametric tests of ARM microcontrollers STM32F1XX. The complex is based on PXI devices by National Instruments and LabVIEW software environment. Data exchange procedure between a microcontroller under test and the complex hardware is describes. Some test results are also presented.
© The Authors, published by EDP Sciences, 2016
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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