| Issue |
MATEC Web Conf.
Volume 79, 2016
VII Scientific Conference with International Participation “Information-Measuring Equipment and Technologies” (IME&T 2016)
|
|
|---|---|---|
| Article Number | 01037 | |
| Number of page(s) | 6 | |
| DOI | https://doi.org/10.1051/matecconf/20167901037 | |
| Published online | 11 October 2016 | |
Using NI PXI Modules for Digital Signal Processing Microprocessor Testing
1 National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), 115409, Moscow, Russia
2 FSUO “MNIIRIP”, 141002, Mytishchi, Russia
* Corresponding author: vamar@spels.ru
The article considers the implementation of the external memory interface based on National Instruments modular PXI equipment for environmental testing of digital signal processing (DSP) microprocessors. The block diagram of the developed device pointing out the advantages and disadvantages of this solution is provided. The block diagram of an improved external memory interface is also shown.
© The Authors, published by EDP Sciences, 2016
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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