Issue |
MATEC Web Conf.
Volume 100, 2017
13th Global Congress on Manufacturing and Management (GCMM 2016)
|
|
---|---|---|
Article Number | 04026 | |
Number of page(s) | 6 | |
Section | Part 4: Equipment manufacturing and New materials | |
DOI | https://doi.org/10.1051/matecconf/201710004026 | |
Published online | 08 March 2017 |
Intelligent Image Segment for Material Composition Detection
1 Tianjin Polytechnic University, Tianjin 300387, China
2 Beijing Shenzhou Aerospace Software Technology Co. Ltd., Beijing, China
3 Department of Electrical and Computer Engineering, Lehigh University, Bethlehem, USA
a lxdtjpu@163.com
b linn@htrdc.com
c perfect_chn@hotmail.com
d wliu@lehigh.edu
In the process of material composition detection, the image analysis is an inevitable problem. Multilevel thresholding based OTSU method is one of the most popular image segmentation techniques. How, with the increase of the number of thresholds, the computing time increases exponentially. To overcome this problem, this paper proposed an artificial bee colony algorithm with a two-level topology. This improved artificial bee colony algorithm can quickly find out the suitable thresholds and nearly no trap into local optimal. The test results confirm it good performance.
Key words: Image segment / artificial bee colony / material composition detection
© The Authors, published by EDP Sciences, 2017
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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