Open Access
MATEC Web Conf.
Volume 355, 2022
2021 International Conference on Physics, Computing and Mathematical (ICPCM2021)
Article Number 03055
Number of page(s) 5
Section Computing Methods and Computer Application
Published online 12 January 2022
  1. HOPKINS A B T, MCDONALD-MAIER K D., “Debug Support for Complex Systems On-Chip: A Review,” IEE Proceedings -Computers and Digital Techniques, vol. 153, pp. 197, 2006. [CrossRef] [Google Scholar]
  2. L. Peng, Y. Li-xin, Q. Hui, Z. Hai-yang, “Summary on Debug Technique of Common Embedded Processors”, MICROPROCESSORS, vol. 04, pp. 16–20, 2011. [Google Scholar]
  3. B. Du, M.S. Reorda, L. Sterpone, et al., “Online Test of Control Flow Errors: A New Debug Interface-Based Approach”, IEEE Trans. Comput. vol. 65, pp.1846–1855, 2016. [CrossRef] [Google Scholar]
  4. IEEE Std P1149. 1-IEEE Standard Test Access Port and Boundary-Scan Architecture, 2001. [Google Scholar]

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.