Open Access
Issue |
MATEC Web Conf.
Volume 327, 2020
2020 4th International Conference on Measurement Instrumentation and Electronics (ICMIE 2020)
|
|
---|---|---|
Article Number | 02003 | |
Number of page(s) | 5 | |
Section | Electronic Materials and Characteristics Analysis | |
DOI | https://doi.org/10.1051/matecconf/202032702003 | |
Published online | 06 November 2020 |
- A. Mecke, I. Lee, J.R. Baker jr., M.M. Banaszak Holl, B.G. Orr, Eur. Phys. J. E 14, 7 (2004) [1]Greco, Giuseppe Iucolano, Ferdinando Roccaforte, Fabrizio, MAT SCI SEMICON PROC., 8, 2018. [CrossRef] [Google Scholar]
- W. Runton, B. Trabert, J. B. Shealy, and R. Vetury, IEEE Microw. Mag., 14, 3, (2013) [CrossRef] [Google Scholar]
- J. J. Komiak, IEEE Microw. Mag., 16, 3, (2015) [CrossRef] [Google Scholar]
- Roccaforte F, Fiorenza P, Greco G, Lo Nigro R, Giannazzo F, Iucolano F, et al. MICROELECTRON ENG. 187-188. (2018) [Google Scholar]
- Yao Y, Huang C, Lin T, Cheng L, Liu C, Wang M, et al. MICROELECTRON ENG. 138, (2014) [Google Scholar]
- Saito W, Takada Y, Kuraguchi M, Tsuda K, Omura I. IEEE T ELECTRON DEV. 53, (2006) [Google Scholar]
- Cai Y, Zhou Y, Lau KM, Chen KJ. IEEE T ELECTRON DEV. 53, (2006) [Google Scholar]
- Yalamarthy AS, Senesky DG. SEMICOND SCI TECH. 31, (2016) [Google Scholar]
- Tong W, Tang W, Zhang Z. COMP MATER SCI. vol. 143, (2017) [Google Scholar]
- Simin G, Koudymov A, Tarakji A, Hu X, Yang J, Khan MA, et al. APPL PHYS LETT. 79, (2001) [Google Scholar]
- Ahmeda K, Ubochi B, Benbakhti B, Duffy SJ, Soltani A, Zhang WD, et al. IEEE ACCESS. 5,( 2017) [Google Scholar]
- O. Hilt, A. Knauer, F. Brunner Proceeding of The 22nd International Symposium on Power Semiconductor Devices&ICs, (2010) [Google Scholar]
- Benkhelifa F, Muller S, Polyakov VM, Ambacher O. IEEE ELECTR DEVICE L. 36 (2015) [Google Scholar]
- Yu ET, Dang XZ, Yu LS, Qiao D, Asbeck PM, Lau SS, et al. APPL PHYS LETT. 73, (1998) [Google Scholar]
- Wright AF., J APPL PHYS. 82, (1998) [Google Scholar]
- Choi S, Kim HJ, Lochner Z, Zhang Y, Lee Y, Shen S, et al. APPL PHYS LETT. 96, (2010) [Google Scholar]
- Liu K, Zhu H, Feng S, Shi L, Zhang Y, Guo C. MICROELECTRON RELIAB. 55, (2015) [Google Scholar]
- Ambacher O, Foutz B, Smart J, Shealy JR, Weimann NG, Chu K, et al. J APPL PHYS. 87, (1999) [Google Scholar]
- Yalamarthy AS, Senesky DG. SEMICOND SCI TECH.. 31,. (2016) [Google Scholar]
- Duffy SJ, Benbakhti B, Kalna K, Boucherta M, Zhang WD, Bourzgui NE, et al. IEEE ACCESS. 6, (2018). [Google Scholar]
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.