Open Access
| Issue |
MATEC Web Conf.
Volume 67, 2016
International Symposium on Materials Application and Engineering (SMAE 2016)
|
|
|---|---|---|
| Article Number | 06103 | |
| Number of page(s) | 5 | |
| Section | Chapter 6 Materials Science | |
| DOI | https://doi.org/10.1051/matecconf/20166706103 | |
| Published online | 29 July 2016 | |
- M. Koh, et. al., Limit of Gate Oxide Thickness Scaling in MOSFETs due to Apparent Threshold Voltage Fluctuation Induced by Tunnel Leakage Current, IEEE Trans.Electron Devices, 43 (2001) 259. [CrossRef] [Google Scholar]
- H. S. Momose et. al., 1.5 nm Direct-Tunneling Gate Oxide Si MOSFET's, IEEE Trans.Electron Devices, 43 (8) (1996) 1233. [CrossRef] [Google Scholar]
- R. Moazzami and C. Hu, Stress-Induced Current in Thin Silicon Dioxide Films, in Proc. Intl. Electron Devices Meeting, (1992) 139. [Google Scholar]
- B. Riccó, G. Gozzi, and M. Lanzoni, Modeling and Simulation of Stress-Induced Leakage Current in Ultrathin SiO2 Films, IEEE Trans.Electron Devices, 45(7) (1998) 1554. [CrossRef] [Google Scholar]
- D. Ielmini, A. S. Spinelli, A. L. Lacaita, and M. J. van Duuren, Defect Generation Statistics in Thin Gate Oxides, IEEE Trans.Electron Devices, 51(8) (2004) 1288 [CrossRef] [Google Scholar]
- K. K. Kumar and N. B. Rao, Sub-threshold Leakage Current Reduction Using Variable Gate Oxide Thickness (VGOT) MOSFET, Microelectronics and Solid State Electronics 2013, 2(2): 24-28 [Google Scholar]
- F. Jiménez-Molinos, A. Palma, F. Gámiz, J. Banqueri, and J. A. Lopez-Villanueva, Physical Model for Trap-Assisted Inelastic Tunneling in Metal-Oxide-Semiconductor Structures, J. Appl. Phys., 90 (7) (2001) 3396. [CrossRef] [Google Scholar]
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.