Open Access
Issue
MATEC Web of Conferences
Volume 61, 2016
The International Seminar on Applied Physics, Optoelectronics and Photonics (APOP 2016)
Article Number 02018
Number of page(s) 6
Section Chapter 2 Electronic Technology and Electrical Engineering
DOI https://doi.org/10.1051/matecconf/20166102018
Published online 28 June 2016
  1. W. Hongmei, L. Ke, Technology Innovation and Application, 16, 26 (2013) [Google Scholar]
  2. Y. Sufang, Chinese Consulting Engineers, 3, 51 (2013) [Google Scholar]
  3. W. Chenghui, Scinence and Technology& Innovation, 7, 66 (2014) [Google Scholar]
  4. R. Wenguang, L. Kun, Q. Haixian, Telecom Word, 15, 93 (2014) [Google Scholar]
  5. L. Qishu, C. Ming, Technology Wind, 125 (2014) [Google Scholar]
  6. C. Haihua, Zhejaing Electric Power, 9, 29 (2013) [Google Scholar]
  7. Z. Li, Technology Wind, 133 (2014) [Google Scholar]
  8. T. Lianhua, Guangdong Science & Technology, 20, 93 (2013) [Google Scholar]
  9. L. Xiang, L. Lingru, Journal of Jiangxi Vocational and Techincal College of Electricity, 3, 16 (2011) [Google Scholar]
  10. S. Jingyu, Construction&Design for Engineering, 65 (2008) [Google Scholar]
  11. L. Guangxing, Inner Mongolia Water Resources, 1, 42 (2013) [Google Scholar]
  12. H.Rong, Sichuan Electric Power Technology, 12, 55 (2009) [Google Scholar]
  13. S.Dianyang, R. Yan, Y. Di, Lamps and Lighting, 3, 45 (2014) [Google Scholar]
  14. L.Song, Z. Kailin, Guangdong Science&Technology, 22, 126 (2013) [Google Scholar]
  15. L. Hong, G. Fei, China Illuminating Engineering Journal, 2, 6 (2006) [Google Scholar]
  16. Z. Huangchagn, China Planning Press, DL/T 5390-2014 [Google Scholar]

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