Open Access
| Issue |
MATEC Web of Conferences
Volume 19, 2014
The 2nd International Youth Forum “Smart Grids”
|
|
|---|---|---|
| Article Number | 01028 | |
| Number of page(s) | 6 | |
| DOI | https://doi.org/10.1051/matecconf/20141901028 | |
| Published online | 15 December 2014 | |
- I.V.Grehov, Bulletin of the Russian Academy of Sciences, 2, (2008) [Google Scholar]
- G.V.Kuznetsov, M.A.Sheremet, Russian Microelectronics, 5, (2009) [Google Scholar]
- A.A.Borisov, V.M.Gorbachev, G.D.Kartashow, M.N.Martynov, S.F.Prytkov, Foreign electronics, 5, (2000) [Google Scholar]
- A.N.Nazarychev, D.A.Andreev, Pedro AntonioE.A. Kireev, Bulletin of the ISPU, 3, (2009) [Google Scholar]
- Yu. A.Fokin, Ya. N.Osipov, Electrical Technology Russia, 5, (2010) [Google Scholar]
- V.V.Afanasev, V.M.Kozhevnikov, Reability, 3, (2012) [Google Scholar]
- V.V.Izmailov, M.VNovoselova, Russian Electrical Engineering, 5, (2009) [Google Scholar]
- M.A.Novikov, P.A.Rashitov, Russian Electrical Engineering, 12, (2013) [Google Scholar]
- V.M.Saltykov, L.M.Suleimanova, Electromechanics, 6, (2007) [Google Scholar]
- M.Sefidgaran, M.Mirzaie, A.Ebrahimzadeh, Int.J. of Elect.Pow.&Ener.Sys., 35, (2012) [Google Scholar]
- W.Li, IEEE Trans Power Syst, 17, (2002) [Google Scholar]
- M.H.J.Bollen, IEEE Trans Ind Appl., 37, (2001) [Google Scholar]
- M.Stötzel, M.Zdrallek, W.H.Wellssow, IEEE Proc Gen Transm Distrib., 48, (2001) [Google Scholar]
- F.R.Ismagilov, D.V.Maksudov, Russian Electrical Engineering, 2, (2012) [Google Scholar]
- E.V.Zenova, V.A.Chernyshov, Bulletin of the MEI, 2, (2011) [Google Scholar]
- D.A.Silva, E.C.M.Costa, J.L.Franco, M.Antonionni, R.C.Jesus, S.R.Abreu, K.Lahti, L.H.I.Mei, J.Pissolato, Int.J. of Elect.Pow.&Ener.Sys., 53, (2013) [Google Scholar]
- G.V.Kuznetsov, E.V.Kravchenko, Elektromagnitnye Volny i Elektronnye Systemy, 3 (2014) [Google Scholar]
- G.V.Kuznetsov, E.V.Kravchenko, Journal of Engineering Physics and Thermophysics, 80 (5), (2007) [Google Scholar]
- E.Suhir, Microelectronics Reliability, 52, (2012) [Google Scholar]
- Y.Wang, M.Enachescu, S.D.Cotofana, L. Microelectronics Reliability, 52, (2012) [Google Scholar]
- S.F.Prytkov, V.M.Gorbachev, Handbook «Reliability of radioelements» (Moscow, 2012) [Google Scholar]
- E.V.Kravchenko, G.V.Kuznetsov, EPJ Web of Conferences, 76, (2014) [Google Scholar]
- G.V.Kuznetsov, E.V.Kravchenko, Elektromagnitnye Volny i Elektronnye Systemy, 10 (11–12), (2005) [Google Scholar]
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