MATEC Web Conf.
Volume 83, 2016CSNDD 2016 - International Conference on Structural Nonlinear Dynamics and Diagnosis
|Number of page(s)||5|
|Section||Nonlinear dynamics in MEMS, NEMS and AFM|
|Published online||16 November 2016|
Effects of a slow harmonic displacement on an Atomic Force Microscope system under Lennard-Jones forces
Laboratory of Renewable Energy and Dynamics of Systems, Faculty of Sciences Aїn Chock, University Hassan II-Casablanca, Casablanca, Morocco
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We focus in this paper on the modeling and dynamical analysis of a tapping mode atomic force microscopy (AFM). The microbeam is subjected to a low frequency harmonic displacement of its base and to the Lennard-Jones (LJ) forces at its free end. Static and modal analysis are performed for various gaps between the tip of the microbeam and a sample. The Galerkin method is employed to reduce the equations of motion to a fast-slow dynamical system. We show that the dynamics of the AFM system is governed by the contact and the noncontact invariant slow manifolds. The tapping mode is triggered via two saddle-node bifurcations of these manifolds. Moreover, the contact time is computed and the effects of the base motion amplitude and the initial gap are discussed.
© The Authors, published by EDP Sciences, 2016
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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