MATEC Web Conf.
Volume 76, 201620th International Conference on Circuits, Systems, Communications and Computers (CSCC 2016)
|Number of page(s)||5|
|Published online||21 October 2016|
Operations on Multiple Transition Faults without Enumeration
1 Synopsys Inc, Mountain View, USA
2 Southern Illinois University, Carbondale, USA
The multiple transition fault model has been used to represent alternative defective gate combinations in the circuit. However, the number of faults is very large even of modest size circuits and therefore the defective configuration may not be considered. It is shown that multiple transition faults can be stored compactly in Binary Decision Diagrams. Furthermore, important operations for identifying the location of failures are implemented without fault enumeration. Experimental results on some of the largest ISCAS’85, ISCAS’89. and ITC’99 benchmarks demonstrate the scalability of the proposed method.
© The Authors, published by EDP Sciences, 2016
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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