MATEC Web of Conferences
Volume 26, 20152015 3rd Asia Conference on Mechanical and Materials Engineering (ACMME 2015)
|Number of page(s)||4|
|Section||Advanced materials and properties|
|Published online||12 October 2015|
Polarized Raman Spectroscopy and Chemometric Analysis of Micro-crystalline Silicon for Solar Cells
1 Department of Electronic and Electrical Engineering, Trinity College Dublin, Ireland
2 ITMO University, St.-Petersburg, Russia
3 School of Physical Sciences, Dublin City University, Ireland
Micro-crystalline silicon (μc-Si:H) is currently under extensive investigation due to it’s applications in solar cells. The crystalline content and structural properties of μc-Si:H can be determined from several characterisation techniques such as high-resolution transmission electron microscopy (HRTEM), X-Ray diffraction (XRD), spectroscopic ellipsometry (SE) and Raman spectroscopy. In this paper a solution is proposed to reduce the effect of second order phonons on the Raman spectra of μc-Si:H for evaluation of crystalline volume fraction χc.
© Owned by the authors, published by EDP Sciences, 2015
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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