| Issue |
MATEC Web of Conferences
Volume 26, 2015
2015 3rd Asia Conference on Mechanical and Materials Engineering (ACMME 2015)
|
|
|---|---|---|
| Article Number | 01011 | |
| Number of page(s) | 4 | |
| Section | Advanced materials and properties | |
| DOI | https://doi.org/10.1051/matecconf/20152601011 | |
| Published online | 12 October 2015 | |
Polarized Raman Spectroscopy and Chemometric Analysis of Micro-crystalline Silicon for Solar Cells
1 Department of Electronic and Electrical Engineering, Trinity College Dublin, Ireland
2 ITMO University, St.-Petersburg, Russia
3 School of Physical Sciences, Dublin City University, Ireland
a adleyd@tcd.ie
b perovat@tcd.ie
c bjorn.mt@gmail.com
d bert.ellingboe@dcu.ie
Micro-crystalline silicon (μc-Si:H) is currently under extensive investigation due to it’s applications in solar cells. The crystalline content and structural properties of μc-Si:H can be determined from several characterisation techniques such as high-resolution transmission electron microscopy (HRTEM), X-Ray diffraction (XRD), spectroscopic ellipsometry (SE) and Raman spectroscopy. In this paper a solution is proposed to reduce the effect of second order phonons on the Raman spectra of μc-Si:H for evaluation of crystalline volume fraction χc.
© Owned by the authors, published by EDP Sciences, 2015
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