MATEC Web of Conferences
Volume 12, 2014FDMD II - JIP 2014 - Fatigue Design & Material Defects
|Number of page(s)
|Session 9: Fatigue Crack Growth and Thresholds at Defects II
|09 June 2014
A new proposal of effective stress and critical distance for fatigue at notches
Department of Mechanical and Manufacturing Engineering, Universidad de Sevilla, Camino de los Descubrimientos s/n. 41092 Sevilla, Spain
The Theory of Critical Distance (TCD) and its associated methods have proved useful for predicting fatigue and fracture failure under stress gradients. This work reports the first analytical deduction of the effective stress and its critical distance in notched components under fatigue. The results, consistent with their LEFM counterparts, indicate that the most accurate representation of the Notch Effective Stress (NES) is the geometric mean of the stresses used in the Point and Line Methods respectively, evaluated at the critical distance of the material proposed by Taylor.
© Owned by the authors, published by EDP Sciences, 2014
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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