Open Access
Issue
MATEC Web Conf.
Volume 413, 2025
International Conference on Measurement, AI, Quality and Sustainability (MAIQS 2025)
Article Number 03005
Number of page(s) 6
Section Artificial Intelligence and Measurement
DOI https://doi.org/10.1051/matecconf/202541303005
Published online 01 October 2025
  1. M. Esteki, S.A. Khajehoddin, A. Safaee, Y. Li, LED Systems Applications and LED Driver Topologies: A Review. IEEE Access 11, 38324-38358 (2023) [Google Scholar]
  2. J. Dong, D. Xiong, Applications of light emitting diodes in health care. Ann. Biomed. Eng. 45, 2509-2523 (2017) [Google Scholar]
  3. L. Zheng, H. He, W. Song, Application of lightemitting diodes and the effect of light quality on horticultural crops: A review. HortScience, 54, 1656-1661 (2019) [Google Scholar]
  4. L. Yu et al., High-speed micro-LEDs for visible light communication: Challenges and progresses. Semicond Sci. Technol. 37, 023001 (2021) [Google Scholar]
  5. Illuminating Engineering Society, IES LM-80: Measuring Lumen Maintenance of LED Light Sources (Illuminating Engineering Society of North America, New York, 2014) [Google Scholar]
  6. Illuminating Engineering Society, IES TM-21: Projecting Long-Term Lumen Maintenance of LED Light Sources (Illuminating Engineering Society of North America, New York, 2011) [Google Scholar]
  7. A. N. Padmasali, S.G. Kini, A lifetime performance analysis of LED luminaires under real-operation profiles. IEEE Trans. Electron Devices 67, 146-153 (2019) [Google Scholar]
  8. A.N. Padmasali, J. Lokesh, S.G. Kini, Design of test method for analysis and estimation of LED luminaire lifetime performance under cycle based realistic operating conditions. IEEE Access, (2024) [Google Scholar]
  9. X.P. Cu, H.A. Bui, Methodologies for Reliability Prediction of Electronic Component in Military Vehicles. Adv. Mil. Technol. 14, 89-98 (2019) [Google Scholar]
  10. M.T. Truong, P. Do, L. Mendizabal, B. Iung, An improved accelerated degradation model for LED reliability assessment with self-heating impacts. Microelectron. Reliab. 128, 114428 (2022) [Google Scholar]
  11. D. Vališ, M. Forbelská, Z. Vintr, Q.T. La, Z. Kohl, Light emitting diode degradation and failure occurrence modelling based on accelerated life test. Eng. Fail. Anal. 169, 109200 (2025) [Google Scholar]
  12. M.S. Jing, Z. Yung, W.K. Fan, J. Ibrahim, Bayesian based lifetime prediction for high power white LEDs. Expert Syst. Appl. 185, 115627 (2021) [Google Scholar]
  13. Q.T. La, Z. Vintr, D. Vališ, Degradation Modelling Of Light-Emitting Diodes Using Gaussian Regression Method, in Proceedings of the 34th European Safety and Reliability Conference, Cracow, (2024), 69-78. [Google Scholar]
  14. R. Gunawan et al., Effect of high current density to defect generation of blue LED and its characterization with transmission electron microscope, in Journal of Physics: Conference Series, (2018), 012023 [Google Scholar]
  15. M.E, Raypah, M. Devarajan, F. Sulaiman, Evaluation of current and temperature effects on optical performance of InGaAlP thin-film SMD LED mounted on different substrate packages. Chinese Physics B 26, 078503 (2017) [Google Scholar]
  16. C. Qian, J. J. Fan, X. J. Fan, A. E. Chernyakov, G. Q. Zhang, Lumen and chromaticity maintenance lifetime prediction for LED lamps using a spectral power distribution method, in 2015 12th China International Forum on Solid State Lighting (SSLCHINA), (2015), 67-70 [Google Scholar]
  17. Y. Bin et al., The study of natural exposure testing for LED lighting system, in 2017 18th International Conference on Electronic Packaging Technology (ICEPT), (2017), 726-730 [Google Scholar]
  18. X. Qu et al., A lifetime prediction method for LEDs considering real mission profiles. IEEE IEEE Trans Power Electron. 32, 8718-8727 (2016) [Google Scholar]
  19. Cree LEDs, HB LED Lamp: High Brightness LED Lamp Reliability Test Standards (Cree LEDs, 2022) [Google Scholar]
  20. M. Li et al., Defect Behavior on the Degradation of AlGaN-Based 234 nm LEDs. IEEE Trans Electron Devices 7, 1102-1108 (2023) [Google Scholar]
  21. J. Zhang, M. Xu, Extrapolated lifetime prediction of light-emitting diode lights based on equivalent average luminance and accelerated degradation tests. Opt. Eng. 63, 014105-014105 (2024) [Google Scholar]
  22. Q. Zhao et al., Research on Degradation of GaN‐ Based Blue LED Caused by γ Radiation under Low Bias. Int J. Opt. 1, 1592695 (2020) [Google Scholar]
  23. M. Wen, M. S. Ibrahim, A. H. Meda, G. Zhang, J. Fan, In-Situ early anomaly detection and remaining useful lifetime prediction for high- power white LEDs with distance and entropybased long short-term memory recurrent neural networks. Expert Syst. Appl. 238, 121832 (2024). [Google Scholar]
  24. S.L.H. Lim, P.L.T. Duong, H. Park, and N. Raghavan, Expedient validation of LED reliability with anomaly detection through multi-output Gaussian process regression. Microelectron. Reliab. 138, 114624 (2022) [Google Scholar]
  25. A.D. Hoang, Z. Vintr, D. Vališ, D. Mazurkiewicz, An approach in determining the critical level of degradation based on results of accelerated test. Maintenance and Reliability 24, 330-337 (2022) [Google Scholar]
  26. S. Yaoyang, S. Bo, The Reliability Assessment of Pulse-Driven Light Emitting Diodes, in 2021 22nd International Conference on Electronic Packaging Technology (ICEPT), (2021), 1-5 [Google Scholar]
  27. L. Mitterhuber, Thermal transient measurement and modelling of a power cycled flip-chip LED module. Microelectron. Reliab. 81, 373-380 (2018) [Google Scholar]
  28. X. X. Wang, L. Jing, Y. Wang, Q. Gao, Q. Sun, The influence of junction temperature variation of LED on the lifetime estimation during accelerated aging test. IEEE Access 7, 4773-4781 (2018) [Google Scholar]
  29. D. Vališ, M. Forbelská, Z. Vintr, Q.T. La, J. Leuchter, Perspective estimation of light emitting diode reliability measures based on multiply accelerated long run stress testing backed up by stochastic diffusion process. Measurement 206, 112222 (2023) [Google Scholar]
  30. M. Soltani et al., Reliability study and thermal performance of LEDs on molded interconnect devices (MID) and PCB. IEEE Access 6, 51669-51679 (2018) [Google Scholar]
  31. P. Lall, H. Zhang, L. Davis, Color shift analysis and modeling of high power warm white pc-LED under high temperature and high humidity environment, in 2017 16th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) (2017), 1161-1175 [Google Scholar]
  32. B. Sun, X. Jiang, K. C. Yung, J. Fan, M. G. Pecht, A review of prognostic techniques for high-power white LEDs. IEEE Trans. Power Electron. 32, 6338-6362 (2016) [Google Scholar]
  33. R. Rocchetta, E. Perrone, A. Herzog, P. Dersin, A. Di Bucchianico, A survey on LED Prognostics and Health Management and uncertainty reduction. Microelectron. Reliab. 157, 115399 (2024) [Google Scholar]
  34. Y. Cao et al., Predicting of luminous flux for a LED array using artificial neural network, in 2020 21st International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) (2020), 1-4 [Google Scholar]
  35. M.H. Chang, M. Kang, M. Pecht, PrognosticsBased LED Qualification Using Similarity-Based Statistical Measure with RVM Regression Model. IEEE Trans. Ind. Electron. 54, 5667 –5677 (2017) [Google Scholar]

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.