MATEC Web Conf.
Volume 77, 20162016 3rd International Conference on Mechanics and Mechatronics Research (ICMMR 2016)
|Number of page(s)||5|
|Published online||03 October 2016|
A research on the reliability of light-emitting diode based on analyzing of chip image
Key Laboratory of Information Science and Technology, Graduate School of Tsinghua University at Shenzhen, Shenzhen 518055, China
This paper proposes a new method for studying the reliability of high-power light-emitting diode (LED) by analyzing chip images taken from a batch of LEDs which are selected to conduct the accelerated aging test lasting for 1400 hours. To exclude the disturbance of electrode in these images, an image processing algorithm based on projection is used to extract the interested section. An index called “dark point” which is related to non-radiative combination to describe the reliability of LED is proposed. The method is based on analyzing the variation trends of dark points in the extracted section of these images. The results show that the proportion of the dark point increases with aging time increasing. The lifetime of LED with higher increasing rate is shorter. Based on the increasing rate of dark point, the lifetime of the chip can be predicted in an easier way.
© The Authors, published by EDP Sciences, 2016
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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