Open Access
MATEC Web Conf.
Volume 374, 2023
International Conference on Applied Research and Engineering (ICARAE2022)
Article Number 01001
Number of page(s) 8
Section 1- Nanotechnology
Published online 05 January 2023
  1. Ş. Ţălu, S. Stach, V. Sueiras, and N. M. Ziebarth, “Fractal Analysis of AFM Images of the Surface of Bowman’s Membrane of the Human Cornea,” Ann. Biomed. Eng., vol. 43, no. 4, pp. 906–916, 2015, doi: 10.1007/s10439-014-1140-3. [Google Scholar]
  2. Ş. Ţălu, M. Bramowicz, S. Kulesza, and S. Solaymani, “Topographic characterization of thin film field-effect transistors of 2,6-diphenyl anthracene (DPA) by fractal and AFM analysis,” Mater. Sci. Semicond. Process., vol. 79, no. February, pp. 144–152, 2018, doi: 10.1016/j.mssp.2018.02.008. [Google Scholar]
  3. F. H. Wang and C. L. Chang, “Effect of substrate temperature on transparent conducting Al and F co-doped ZnO thin films prepared by rf magnetron sputtering,” Appl. Surf. Sci., vol. 370, pp. 83–91, 2016, doi: 10.1016/j.apsusc.2016.02.161. [Google Scholar]
  4. E. S. Gadelmawla, M. M. Koura, T. M. A. Maksoud, I. M. Elewa, and H. H. Soliman, “Roughness parameters,” J. Mater. Process. Technol., vol. 123, no. 1, pp. 133–145, 2002, doi:10.1016/S0924-0136(02)00060-2. [Google Scholar]
  5. F. M. Mwema, E. T. Akinlabi, and O. P. Oladijo, Sputtered Thin Films: Theory and Fractal Descriptions. CRC Press, 2021. [Google Scholar]
  6. G. Liu, L. Wu, and F. Zhang, “Multifractal spectra of atomic force microscope images of lanthanum oxide thin films deposited by electron beam evaporation,” Mater. Sci. Semicond. Process., vol. 31, pp. 14–18, Mar. 2015, doi: 10.1016/j.mssp.2014.11.011. [Google Scholar]
  7. F. M. Mwema, E. T. Akinlabi, and O. P. Oladijo, “Fractal analysis of hillocks: A case of RF sputtered aluminum thin films,” Appl. Surf. Sci., vol. 489, pp. 614–623, Sep. 2019, doi: 10.1016/j.apsusc.2019.05.340. [Google Scholar]
  8. S. Nazarpour and M. Chaker, “Fractal analysis of Palladium hillocks generated due to oxide formation,” Surf. Coatings Technol., vol. 206, no. 11–12, pp. 2991–2997, 2012, doi: 10.1016/j.surfcoat.2011.12.036. [Google Scholar]
  9. R. P. Yadav, S. Dwivedi, A. K. Mittal, M. Kumar, and A. C. Pandey, “Fractal and multifractal analysis of LiF thin film surface,” Appl. Surf. Sci., vol. 261, pp. 547–553, 2012, doi: 10.1016/j.apsusc.2012.08.053. [Google Scholar]
  10. A. V. Dvornichenko and V. O. Kharchenko, “Scaling properties of the growing monolayer on the disordered substrate,” Phys. Lett. A, vol. 384, no. 16, p. 126329, Jun. 2020, doi: 10.1016/j.physleta.2020.126329. [Google Scholar]
  11. L. Zuo, D. Zuo, Y. Zhu, and H. Wang, “Effect of process parameters on surface topography of friction stir welding,” Int. J. Adv. Manuf. Technol., vol. 98, no. 5–8, pp. 1807–1816, Sep. 2018, doi: 10.1007/s00170-018-2326-x. [Google Scholar]
  12. Ş. Ţălu et al., “Micromorphology analysis of specific 3-D surface texture of silver chiral nanoflower sculptured structures,” J. Ind. Eng. Chem., vol. 43, pp. 164–169, 2016, doi: 10.1016/j.jiec.2016.08.003. [Google Scholar]
  13. F. M. Mwema, E. T. Akinlabi, and O. P. Oladijo, Demystifying Fractal Analysis of Thin Films: A Reference for Thin Film Deposition Processes. 2021. [Google Scholar]
  14. Ş. Ţălu, S. Stach, D. Raoufi, and F. Hosseinpanahi, “Film thickness effect on fractality of tin-doped In2O3 thin films,” Electron. Mater. Lett., vol. 11, no. 5, pp. 749–757, Sep. 2015, doi: 10.1007/s13391-015-4280-1. [Google Scholar]
  15. D. Siniscalco, M. Edely, J. F. Bardeau, and N. Delorme, “Statistical analysis of mounded surfaces: Application to the evolution of ultrathin gold film morphology with deposition temperature,” Langmuir, vol. 29, no. 2, pp. 717–726, 2013, doi: 10.1021/la304621k. [Google Scholar]
  16. E. Ji, C. Cummins, and G. Fleury, “Precise synthesis and thin film self-assembly of PLLA-b-PS bottlebrush block copolymers,” Molecules, vol. 26, no. 5, 2021, doi: 10.3390/molecules26051412. [Google Scholar]
  17. F. Alfeel, F. Awad, I. Alghoraibi, and F. Qamar, “Using AFM to Determine the Porosity in Porous Silicon,” J. Mater. Sci. Eng. A, vol. 2, no. 9, pp. 579–583, 2012. [Google Scholar]
  18. D. Q. Tan, “Differentiation of roughness and surface defect impact on dielectric strength of polymeric thin films,” IET Nanodielectrics, vol. 3, no. 1, pp. 28–31, Mar. 2020, doi: 10.1049/iet-nde.2019.0031. [CrossRef] [Google Scholar]
  19. J. L. Clabel H. et al., “Growth process and grain boundary defects in Er doped BaTiO3 processed by EB-PVD: A study by XRD, FTIR, SEM and AFM,” Appl. Surf. Sci., vol. 493, no. July, pp. 982–993, Nov. 2019, doi: 10.1016/j.apsusc.2019.07.003. [Google Scholar]

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.