Open Access
Issue |
MATEC Web Conf.
Volume 252, 2019
III International Conference of Computational Methods in Engineering Science (CMES’18)
|
|
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Article Number | 09005 | |
Number of page(s) | 4 | |
Section | Probability, Statistics Quality Control | |
DOI | https://doi.org/10.1051/matecconf/201925209005 | |
Published online | 14 January 2019 |
- G.F. Eichinger; K. Baumann; T. Martin; M. Jones Proceedings of the 11th IEEE International Symposium on Wearable Computers 11–13 (2007) [Google Scholar]
- T. Linz, L. Gourmelon, G. Langereis International Workshop on Wearable and Implantable Body Sensor Networks (BSN 2007), 29–34 (2007) [CrossRef] [Google Scholar]
- C. JaeHan, Y. Kim, K. Lee, Y.C. Chung IEEE Antennas and Propagation Society International Symposium 5–11 (2008) [Google Scholar]
- T. Xuyuan, K. Vladan, H. Tzu-Hao, S. Chien-Lung, K. Ya-Chi, J. Gwo-Tsuen Sensors 17, 673 (2017) [CrossRef] [Google Scholar]
- A. Jakubas, E. Łada-Tondyra The Journal of The Textile Institute (2018) doi.org/10.1080/00405000.2017.1422308 [Google Scholar]
- J. Zięba, M. Frydrysiak, K. Gniotek FIBRES & TEXTILES in Eastern Europe 15(5) 64 - 65(2007) [Google Scholar]
- X. Tao, V. Koncar, T.H. Huang, C.L. Shen, Y.C. Ko, G.T. Jou: Sensors (Basel) 17(4): 673 (2017). [CrossRef] [Google Scholar]
- L. Kasprzyk, A. Tomczewski, K. Bednarek Przeglad Elektrotechniczny 87(12) 82-85 (2011) [Google Scholar]
- L. Kasprzyk, K. Bednarek Przeglad Elektrotechniczny 85(12) 65-68 (2009) [Google Scholar]
- E. Korzeniewska, M. Walczak, J. Rymaszewski MIXDES 24th International Conference “Mixed Design of Integrated Circuits and Systems 447 - 450, article number 8005250 (2017) [Google Scholar]
- B. Warcholiński, A. Gilewicz, P. Myśliński Reviews on Advanced Materials Science. 22(2009) 81-88 [Google Scholar]
- X. Li, W. Yue, C. Wang, J. Liu, G. Li Journal of Tribology 139 (6) (2017) [Google Scholar]
- N. W. Khun, A. Neville, I. Kolev, H. Zhao Journal of Tribology 138 (3) doi: 10.1115/1.4031995 (2016) [Google Scholar]
- J. Jozwik, L. Semotiuk, I. Kuric, Adv. Sci. Technol. Res. J. 2015; 9(28):96–102 [CrossRef] [Google Scholar]
- R. Pawlak, E. Korzeniewska, Z. Stempien, Selected Issues of Electrical Engineering and Electronics, WZEE 2016, 7800248 (2016) [Google Scholar]
- E. Korzeniewska, J. Józwik, R. Zawiślak, A. Krawczyk, J. Michałowska Przeglad Elektrotechniczny 12(93) 111-114 (2017) [Google Scholar]
- M. Barszcz, J. Józwik, K. Dziedzic, K. Stec. E3S WEB OF CONFERENCES. 2017, vol. 19, s. 1-6 [Google Scholar]
- G. M. Krolczyk, J. B. Krolczyk, R. W. Maruda, S. Legutko, M. Tomaszewski Measurement 88 176–185 (2016) [CrossRef] [Google Scholar]
- R. Pawlak, M. Lebioda, J. Rymaszewski, W. Szymanski, L. Kołodzieczyk, P. Kula, Sensors 17(1) article number: 51 (2017) [Google Scholar]
- Jozwik, Jerzy; Czwarnowski, Marek : Adv. Sci. Technol. Res. J. 2015; 9(28):89–95. [CrossRef] [Google Scholar]
- G. M. Krolczyk, P. Nieslony, R. W. Maruda, S. Wojciechowski Journal of Cleaner Production 142 3343-3354 (2017) [CrossRef] [Google Scholar]
- J. Jozwik: Tehnicki Vjesnik Technical Gazette. 2018, nr 25, Supl.1, s. 170-175 [Google Scholar]
- M. Pashechko, K. Dziedzic, E. Mendyk, J. Jozwik Journal of Tribology 140 (2) (2017) DOI: 10.1115/1.4037953 [Google Scholar]
- T. Światczak, M. Tomczyk, B. Więcek, R. Pawlak, R. Olbrycht Materials Science and Engineering B: Solid-State Materials for Advanced Technology 177 (15) 1239-1242 (2012) [Google Scholar]
- T. Rymarczyk; P. Adamkiewicz, J. Sikora, Przeglad elektrotechniczny, 94 (1), 93-96 (2018). [Google Scholar]
- T. Rymarczyk; J. Szumowski, P. Adamkiewicz, P. Tchórzewski, J. Sikora, Przeglad elektrotechniczny, 94 (1) 97-100 (2018). [Google Scholar]
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