Open Access
MATEC Web Conf.
Volume 76, 2016
20th International Conference on Circuits, Systems, Communications and Computers (CSCC 2016)
Article Number 01004
Number of page(s) 6
Section Circuits
Published online 21 October 2016
  1. W.L. Luyben, Chemical reactor design and control (John Wiley & Sons, Chichester, 2007) [Google Scholar]
  2. D.E. Seborg, T.F. Edgar, D.A. Mellichamp, Process Dynamics and Control (John Wiley & Sons, Chichester, 1989) [Google Scholar]
  3. P. Dostál, V. Bobál, J. Vojtěšek, Proc. of 22nd European Conference on Modelling and Simulation, 487–492, Cyprus (2008). [CrossRef] [Google Scholar]
  4. J. F. Smuts, Process control for practitioners (OptiControls Inc., New York, 2011) [Google Scholar]
  5. M. King, Process control: A practical approach (John Wiley & Sons, Chichester, 2010) [Google Scholar]
  6. R. Schmidt, Chemical process design and integration (John Wiley & Sons, Chichester, 2005) [Google Scholar]
  7. H. Garnier, L. Wang (eds.), Identification of continuous-time models from sampled data (Springer-Verlag, London, 2008) [CrossRef] [Google Scholar]
  8. S. Mukhopadhyay, A.G. Patra, G.P. Rao, Int. J. Contr. 55, (1992). [Google Scholar]
  9. D.L. Stericker, N.K. Sinha, Control-theory and adv. Technol. 9, (1993) [Google Scholar]
  10. V. Kučera, D. Henrion, Proc of IFAC Symposium Robust Control Design, Prague (2000) [Google Scholar]
  11. J. Mikleš, M. Fikar, Process modellig, identification and control 2 (STU Press, Bratislava, 2004) [Google Scholar]
  12. V. Bobál, J. Böhm, J. Fessl, J. Macháček, Digital self-tuning controllers (Springer Verlag, Berlin, 2005) [Google Scholar]

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.