Open Access
MATEC Web Conf.
Volume 75, 2016
2016 International Conference on Measurement Instrumentation and Electronics (ICMIE 2016)
Article Number 09007
Number of page(s) 4
Section System Modeling and Analysis
Published online 01 September 2016
  1. A. J. Schwartz, M. Kumar, B. L. Adams, and D. P. Field, Electron Backscatter Diffraction in Materials Science, 2nd. ed. Springer, New York, (2009). [CrossRef]
  2. E. Guilmeau, C. Henrist, T. S. Suzuki, Y. Sakka, D. Chateigner, D. Grossin, and B. Ouladiaf, ICOTOM 14, 179, (2005).
  3. S. Piazolo, V. G. Sursaeva, and D. J. Prior, ICOTOM 14, 213 (2005).
  4. M. V. Sypchenko, T. I. Savyolova, Cristallogr. Rep. 55 (4), 546 (2010). [CrossRef]
  5. A.O. Antonova, T. I. Savyolova, Comput. Math. Math. Phys. 55 (2), 317 (2015). [CrossRef]
  6. A.O. Antonova, T. I. Savyolova, Cristallogr. Rep. 61 (3), 1 (2016). [CrossRef]
  7. T. I. Savyolova, T. M. Ivanova, and M. V. Sypchenko, Methods for Solving Ill-Posed Problems in Texture Analysis and Their Applications, Mosk. Inzh._Fiz. Inst., Moscow, (2012) [in Russian].
  8. N. Bozzolo, F. Gerspach, G. Sawina, and F. Wagner, J. Microscopy. 227, 275 (2007). [CrossRef]
  9. V.A. Gribkov, F.I. Grigoriev, B.A. Kalin, V.L. Yakushin, Advanced Radiation-Beam Technologies of Materials Treatment, Krugly God, Moscow, (2001). [in Russian].

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