Open Access
MATEC Web Conf.
Volume 71, 2016
The International Conference on Computing and Precision Engineering (ICCPE 2015)
Article Number 04001
Number of page(s) 4
Section Advanced Manufacturing and Analysis Technology
Published online 02 August 2016
  1. A. R. Cho, E. H. Kim, S. Y. Park and L. S. Park: Synth. Met. 193, 77 (2014). [CrossRef]
  2. L. Ke, H. Liu, M. Yang, Z. Jiao and X. Sun: Chem. Phys. Lett. 623, 68 (2015).
  3. X. Wu, J. Liu and G. He: Org. Electron. 22, 160 (2015). [CrossRef]
  4. P. F. Carcia, R. S. McLean, M. H. Reilly, M. D. Groner and S. M. George: Appl. Phys. Lett. 89, 319151 (2006). [CrossRef]
  5. P. Mandlik, J. Gartside, L. Han, I. C. Cheng, S. Wagner, J. A. Silvernail, R. Q. Ma, M. Hack and J. J. Brown: Appl. Phys. Lett. 92, 1033091 (2008). [CrossRef]
  6. J. H. Choi, Y. M. Kim, Y. W. Park, T. H. Park, J. W. Jeong, H. J. Choi, E. H. Song, J. W. Lee, C. H. Kim and B. K. Ju: Nanotechnol. 21, 475203 (2010). [CrossRef]
  7. Y. C. Han, E. Kim, W. Kim, Y. G. Im, B. S. Bae and K. C. Choi: Org. Electron. 14, 1435 (2013). [CrossRef]
  8. E. Kim, Y. C. Han, W. Kim, K. C. Choi, Y. G. Im and B. S. Bae: Org. Electron. 14, 1737 (2013). [CrossRef]
  9. A. Singh, F. Nehm, L. Muller-Meskamp, C. Hosbach, M. Albert, U. Schroeder, K. Leo and T. Mikolajick: Org. Electron. 15, 2587 (2014). [CrossRef]
  10. Y. Q. Yang, Y. Duan, Y. H. Duan, X. Wang, P. Chen, D. Yang, F. B. Sun and K. W. Xue: Org. Electron. 15, 1120 (2014). [CrossRef]
  11. H. Klumbies, P. Schmidt, M. Hahnel, A. Singh, U. Schroeder, C. Richter, T. Mikolajick, C. Hosbach, M. Albert, J. W. Bartha, L. Leo and L. Muller-Meskamp: Org. Electron. 17, 138 (2015). [CrossRef]

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.