Open Access
MATEC Web of Conferences
Volume 44, 2016
2016 International Conference on Electronic, Information and Computer Engineering
Article Number 02057
Number of page(s) 5
Section Electronics, Information and Engineering Application
Published online 08 March 2016
  1. W. C. Heerens. Application of capacitance technique sinsensors. [J]. Phys. Sci. instrum. No. 19: [Google Scholar]
  2. Yan Youjun. Based on the virtual instrument, the. [J]. sensor and the micro system of the dynamic non-contact type silicon wafer tester, 2010. (29)3: 59–61 [Google Scholar]
  3. Yan Zhonghao, Tan Zugen. Non electrical measurement technology [M]. Shenyang: Shenyang University of Technology, Zhejiang University. ISBN 7-111-01803-6/TM.233 [Google Scholar]
  4. Shanghai Yunsheng Microelectronics Co., Ltd., <capacitance signal conversion ratio of voltage output interface integrated circuit cav424>,[M] [Google Scholar]
  5. Cao Xiaohua et al. Journal of Hebei Institute of science and technology based on the dynamic thickness measurement technology based on single chip capacitance sensor [J]., 2007, (01): 69–71 [Google Scholar]
  6. Wang Xinhua, Ma Yuzhen et al. Research on plastic film thickness measurement system based on capacitance sensor [J]. Journal of sensing technology, 2005, 3(18-1): 116–119 [Google Scholar]
  7. Bian Xiaona, Liu Jing, Zhao Lizhi. Circuit design of capacitance sensor [J]. instrument technique and sensor. 2008,(6):104–106 [Google Scholar]
  8. Zhang Honggang, Wang Xinhang, Zheng Yizhong. Capacitance plate on-line thickness measuring instrument [J]. instrument and meter. 2000. 4: 13–14 [Google Scholar]
  9. Meng Fanwen, Zhang Yuxiang, Liang Haixia. High LJ, high precision capacitive displacement sensor design of [J]. sensor world. 2007,(3):16–17, 31 [Google Scholar]
  10. Jia Min ye, Zhang Tao, Thou Lipu. Both inside and outside the ring capacitance sensor sensitivity simulation [J]. Days Tianjin University School Newspaper (Natural Science and engineering and Technology Edition). 2008, 41 (11): 1309–1311 [Google Scholar]
  11. Cao Xiaohua, Yang Yinbao, Yin Zhitian. Dynamic thickness measurement based on single chip capacitor sensor [J]. Journal of Hebei Institute of Technology. 2007, 29 (1): 69–71 [Google Scholar]

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