MATEC Web of Conferences
Volume 32, 2015International Symposium of Optomechatronics Technology (ISOT 2015)
|Number of page(s)||6|
|Section||Fabrication and processing|
|Published online||02 December 2015|
- K. Bolotin, K. Sikes, Z. Jiang, M. Klima, G. Fudenberg, J. Hone, P. Kim, and H. Stormer, “Ultrahigh electron mobility in suspended graphene,” Solid State Communications, vol. 146, no. 9–10, pp. 351–355, Jun. 2008. [CrossRef]
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- A. Pirkle, J. Chan, A. Venugopal, D. Hinojos, C. W. Magnuson, S. McDonnell, L. Colombo, E. M. Vogel, R. S. Ruoff, and R. M. Wallace, “The effect of chemical residues on the physical and electrical properties of chemical vapor deposited graphene transferred to sio2,” Applied Physics Letters, vol. 99, no. 12, p. 122108, 2011. [CrossRef]
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- B. Vasic, M. Kratzer, A. Matkovic, A. Nevosad, U. Ralevic, D. Jovanovic, C. Ganser, C. Teichert, and R. Gajic, “Atomic force microscopy based manipulation of graphene using dynamic plowing lithography,” Nanotechnology, vol. 24, no. 1, p. 015303, 2013. [CrossRef]
- Y. Zhang, L. Liu, N. Xi, Y. Wang, and Z. Dong, “Cutting graphene using an atomic force microscope based nanorobot,” in Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on, 2010, pp. 639–644.
- S. Zimmermann, S. Barragan, and S. Fatikow, “Nanorobotic processing of graphene: A platform tailored for rapid prototyping of graphene-based devices.” Nanotechnology Magazine, IEEE, vol. 8, no. 3, pp. 14–19, 2014. [CrossRef]
- C. Diederichs, M. Bartenwerfer, M. Mikczinski, S. Zimmermann, T. Tiemerding, C. Geldmann, H. Nguyen, C. Dahmen, and S. Fatikow, “A rapid automation framework for applications on the microand nanoscale,” in Proceedings of Australasian Conference on Robotics and Automation, 2013.
- S. Zimmermann, T. Tiemerding, T. Li, W. Wang, Y. Wang, and S. Fatikow, “Automated mechanical characterization of 2-d materials using sem based visual servoing,” International Journal of Optomechatronics, vol. 7, no. 4, pp. 283–295, Oct. 2013. [CrossRef]
- S. Zimmermann, T. Tiemerding, and S. Fatikow, “Automated robotic manipulation of individual colloidal particles using vision-based control,” Mechatronics, IEEE/ASME Transactions on, vol. PP, no. 99, pp. 1–8, 2014.
- K. S. Novoselov, A. K. Geim, S. V. Morozov, D. Jiang, Y. Zhang, S. V. Dubonos, I. V. Grigorieva, and A. A. Firsov, “Electric field effect in atomically thin carbon films,” Science, vol. 306, no. 5696, pp. 666–669, 2004. [CrossRef] [PubMed]
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- H. Li, J. Wu, X. Huang, G. Lu, J. Yang, X. Lu, Q. Xiong, and H. Zhang, “Rapid and reliable thickness identification of two-dimensional nanosheets using optical microscopy,” ACS Nano, vol. 7, no. 11, pp. 10344–10353, Nov. 2013. [CrossRef]
- C. M. Nolen, G. Denina, D. Teweldebrhan, B. Bhanu, and A. A. Balandin, “High-throughput large-area automated identification and quality control of graphene and few-layer graphene films,” ACS Nano, vol. 5, no. 2, pp. 914–922, Feb. 2011. [CrossRef]
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- S. B. Aksu and J. A. Turner, “Calibration of atomic force microscope cantilevers using piezolevers,” Review of Scientific Instruments, vol. 78, no. 4, p. 043704, 2007. [CrossRef]
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