Issue |
MATEC Web Conf.
Volume 395, 2024
2023 2nd International Conference on Physics, Computing and Mathematical (ICPCM2023)
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Article Number | 01001 | |
Number of page(s) | 5 | |
DOI | https://doi.org/10.1051/matecconf/202439501001 | |
Published online | 15 May 2024 |
Improvement of thermally induced current bifurcation in VCSEL arrays with non-uniform series resistance design
1 Institute of Microelectronics, Faculty of Information Technology, Beijing University of Technology, Beijing 100124, China
2 Institute of Advanced Technology on Semiconductor Optics & Electronics, Institute of Laser Engineering, Faculty of Materials and Manufacturing, Beijing University of Technology, Beijing 100124, China
* Corresponding author: dyjin@bjut.edu.cn
Non-uniform series resistance design of VCSEL arrays is studied to improve thermally induced current bifurcation based on an electro-opto-thermal model of VCSEL arrays. Taking an 850nm VCSEL array with 4×4 cells for example, the impact of series resistance on current bifurcation is investigated. Increasmg series resistance is helpful to enhance the critical current values of current bifurcation point (Irc) and hence delay the current bifurcation phenomenon. For VCSEL array with non-uniform series resistance, Irc is increased by 28.6% and the total output optical power is enhanced by 14.3% when compared with that of VCSEL array with uniform series resistance. Therefore, non-uniform series resistance design is a better method for delaying the current bifurcation phenomenon and enhancuig the output optical power of VCSEL arrays.
Key words: VCSEL array / Thermally induced current bifurcation / Electro-opto-thermal model / Non-uniform series resistance design
© The Authors, published by EDP Sciences, 2024
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