MATEC Web Conf.
Volume 321, 2020The 14th World Conference on Titanium (Ti 2019)
|Number of page(s)||4|
|Section||Microstructure - Properties Relationships|
|Published online||12 October 2020|
Orientation mapping of cp-Ti by reflected polarized light microscopy
Technische Universität Kaiserslautern (TUK), Materials Testing, Gottlieb-Daimler-Str., 67663, Kaiserslautern, Germany
Deformation and fracture mechanisms, and therefore mechanical behavior, in metals and metallic alloys with hexagonal close packed structures, such as α-Ti, strongly depend on the crystal c-axis orientation of the grains. Taking advantage of the intrinsic optical anisotropy that these structures present, a computer-aided method based on conventional reflected polarized light microscopy has been developed for c-axis orientation mapping. The application of the method on texture-free and textured commercially pure Ti is proposed for the examination of relevant crystallographic features.
© The Authors, published by EDP Sciences, 2020
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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