Issue |
MATEC Web Conf.
Volume 173, 2018
2018 International Conference on Smart Materials, Intelligent Manufacturing and Automation (SMIMA 2018)
|
|
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Article Number | 02004 | |
Number of page(s) | 8 | |
Section | Automation and Nontraditional Manufacturing | |
DOI | https://doi.org/10.1051/matecconf/201817302004 | |
Published online | 19 June 2018 |
The Design of High Speed Acquisition and Storage System Based on Labview
Southwest Forestry University School of Big Data and Intelligent Engineering,, Kunming,, China
a Corresponding author: 393173027@qq.com.cn
b Corresponding author: 13295135@qq.com.cn
c Corresponding author: 844812376@qq.com.cn
d Corresponding author: 2780187915@qq.com.cn
e Corresponding author: 2734557915@qq.com.cn
f Corresponding author: 526487671@qq.com.cn
The design of high speed data acquisition and storage system is based on Labview. It can not only achieve high accuracy and high data rate but also use the software and hardware synchronization trigger to complete the multi-channel continuous real-time monitoring of the acquisition and storage periodic signal. Which is similar to the function of the oscilloscope. This system is based on high speed data acquisition card of NI company and Labview 2012 for PC software development platform. Data acquisition card is used to finish data acquisition of periodic signal through the serial port. It also collect data upload to upper computer. Upper computer collect data for storage display and analysis to realize the real-time monitor of multi-channel analog. The design of the sampling channel is 2, the sampling rate up to 200M/s, the sampling precision is 12 bits, and the sampling depth is 2000. Lots of verification prove that the design has good compatibility, performance and stability of the collection. Data error is negligible by analyzing the data collected. More importantly, the design can be as far as possible to restore the actual signal source data without distortion. This paper provides a portable design for high speed data acquisition, which can be widely applied in the engineering of modern test and measurement technology.
© The Authors, published by EDP Sciences, 2018
This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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