Issue |
MATEC Web Conf.
Volume 155, 2018
VIII International Scientific and Practical Conference “Information and Measuring Equipment and Technologies“ (IME&T 2017)
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Article Number | 01021 | |
Number of page(s) | 6 | |
DOI | https://doi.org/10.1051/matecconf/201815501021 | |
Published online | 28 February 2018 |
Near-Field Interference Microwave Diagnostics of Cultural Plants and Wood Materials
National Research Tomsk State University, Radio Physics Department, 634050 Tomsk, Russia
* Corresponding author: bvp@mail.tsu.ru
A schematic solution of the near-field interference microwave microscopy technology is discussed. This solution is implemented in the form of a maximally simplified microscope structure. Testing was conducted to determine the capabilities of this microscope. It is shown that technology can be used to solve a number of hygroscopy and defectoscopy problems.
© The Authors, published by EDP Sciences, 2018
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (http://creativecommons.org/licenses/by/4.0/).
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