| Issue |
MATEC Web Conf.
Volume 155, 2018
VIII International Scientific and Practical Conference “Information and Measuring Equipment and Technologies“ (IME&T 2017)
|
|
|---|---|---|
| Article Number | 01020 | |
| Number of page(s) | 12 | |
| DOI | https://doi.org/10.1051/matecconf/201815501020 | |
| Published online | 28 February 2018 | |
Application of the E – Layer Model for Solving the Problems of Parametric Estimation in Measuring Devices
Altai State Technical University, 656038, Barnaul, Russia
* Corresponding author: yakunin@agtu.secna.ru
The article proposes a technique for estimating the maximum possible errors in measuring the parameters of the signals observed against a background of interference that do not exhibit statistical properties on the measurement interval and of which only the region of their possible change is known. This region is a layer within which the interference-free signal can vary due to the variation in the values of the parameters of the model function describing it. The technique is also proposed that makes it possible to estimate the measurement error of the monitored parameter for a specific implementation of the signal described by the proposed model with a confidence probability close to unity. An example of the use of the offered techniques for estimating the coordinate of a light stain created by a point source is shown. The offered approach is actual, when each measurement represents special worth and there is no possibility to improve the measurement result by averaging over the set of signal realizations.
© The Authors, published by EDP Sciences, 2018
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (http://creativecommons.org/licenses/by/4.0/).
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