| Issue |
MATEC Web Conf.
Volume 136, 2017
2017 2nd International Conference on Design, Mechanical and Material Engineering (D2ME 2017)
|
|
|---|---|---|
| Article Number | 02005 | |
| Number of page(s) | 5 | |
| Section | Chapter 2: Design | |
| DOI | https://doi.org/10.1051/matecconf/201713602005 | |
| Published online | 14 November 2017 | |
Design of Resistive Grain Moisture On-line Detector
1 School of Mechanical and Electrical Engineering, Wuhan University of Technology, Wuhan 430070, China
2 Hubei Digital Manufacturing Key Laboratory, Wuhan University of Technology, Wuhan 430070, China
a Corresponding author: wuchaohuavip@163.com
Grain moisture detection is of great significance to the acquisition, transportation, storage, processing and trade of grain. This paper designs and develops a resistive grain moisture on-line detector, which uses the least squares method for data calibration and stores the calibrated data in the STC15F2K08S2 microcontroller. The grain moisture content is obtained by processing the collected grain resistance and grain temperature. When the grain moisture content exceeds the set value of grain moisture detector, the microcontroller will automatically control the opening of grain drying equipment so as to prevent the grain moisture content from being too high and causing mildew. Through the experimental data analysis and operation test, the detector can accurately detect the moisture content of wheat, barley, rapeseed, rice and other grain and automatically control the drying equipment, and it has the advantages of fast response, high accuracy and strong practicality, so it can meet the national grain testing accuracy requirements and automatic drying requirements.
© The Authors, published by EDP Sciences, 2017
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (http://creativecommons.org/licenses/by/4.0/).
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