Issue |
MATEC Web Conf.
Volume 135, 2017
8th International Conference on Mechanical and Manufacturing Engineering 2017 (ICME’17)
|
|
---|---|---|
Article Number | 00077 | |
Number of page(s) | 12 | |
DOI | https://doi.org/10.1051/matecconf/201713500077 | |
Published online | 20 November 2017 |
The effect of white etching layer patches on a larger rail defect
1
Department of Mechanical Engineering, Universiti Tun Hussein Onn Malaysia, Parit Raja, 86400 Batu Pahat, Johor, Malaysia
2
Department of Mechanical Engineering, University of Sheffield, S1 3JD Sheffield, UK
* Corresponding author: shahmir@uthm.edu.my
Manufacturing defects such as porosity that formed in the rail could result in catastrophic failure if it remain in service. In this study, a crack that initiated from a large void was modelled using boundary element model to investigate the effect of white etching layer patches on larger defects in rail. The configuration studied represents a large defect in the rail that was observed from a rail removed from service. These investigation has provided a better understanding of how a crack initiated from a larger defect grows under the effect of white etching layer. The results highlight that a continuous white etching layer region will dominates the growth of the crack compared to a patches white etching layer region for a smaller crack size while patches of white etching layer will accelerates the crack growth for a larger crack size. The crack growth predicted in this study for a small crack size is at least 6 times higher than the wear rate mentioned in the literature and will increase further if the expansion of a transformed layer is considered making it impossible to be removed by natural wear.
© The Authors, published by EDP Sciences, 2017
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (http://creativecommons.org/licenses/by/4.0/).
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