MATEC Web Conf.
Volume 129, 2017International Conference on Modern Trends in Manufacturing Technologies and Equipment (ICMTMTE 2017)
|Number of page(s)
|Modelling of Technical Systems. CAD/CAM/CAE Systems
|07 November 2017
Prediction of electronic nanodevices technical status and reliability based on analysis of their performance parameters kinetics under the influence of external factors
Bauman Moscow State Technical University, 105005 Moscow, Russia
* Corresponding author: firstname.lastname@example.org
The problems of technical diagnostics of electronic nanoobjects and devices based on them are considered. Algorithms for constructing the operability and reliability prediction fields of electronic nanoobjects and devices based on them in the specified operation conditions are given.
© The Authors, published by EDP Sciences, 2017
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (http://creativecommons.org/licenses/by/4.0/).
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