| Issue |
MATEC Web Conf.
Volume 76, 2016
20th International Conference on Circuits, Systems, Communications and Computers (CSCC 2016)
|
|
|---|---|---|
| Article Number | 02025 | |
| Number of page(s) | 4 | |
| Section | Systems | |
| DOI | https://doi.org/10.1051/matecconf/20167602025 | |
| Published online | 21 October 2016 | |
Influence of measurement conditions and used devices on consequential creep modulus
Tomas Bata University in Zlin, TGM 5555, Zlin, 760 01 Czech Republic
a Corresponding author: mreznicek@ft.utb.cz
This research deals with study of the possibilities of the creep properties measurement on dedicated devices for the creep measurement and on devices, which enable the creep properties measurement. A comparison of these two different measurement methods show the influence of boundary conditions on the measurement result. Simultaneously, the effort to shorten the long-term tests, because of time saving during research and development of new materials, is confronted here. Radiation crosslinking samples of high-density polyethylene (HDPE), which enable the change of the internal structure to the spatial network by the influence of beta radiation, were chosen as an example for comparison.
© The Authors, published by EDP Sciences, 2016
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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