MATEC Web of Conferences
Volume 34, 20152015 2nd International Conference on Mechatronics and Mechanical Engineering (ICMME 2015)
|Number of page(s)||5|
|Section||Mechanical design and manufacturing|
|Published online||11 December 2015|
The research of device for measuring film thickness of intelligent coating machine
Yantai Automobile Engineering Professional College ShanDong, China
a Wanjun Wang: email@example.com
Ion beam sputtering machine uses computer to real time monitor the change of film thickness in the preparation process of soft X ray multilayer element fabrication. It solves the problems of uneven film thickness and too thick film thickness and so on, which exist in the original preparation process. The high-precision quartz crystal converts film thickness measurement into frequency measurement. The equal precision frequency meter based on FPGA measures the frequency. It can reduce the signal delay and interference signal of discrete components, accordingly improving the accuracy of measurement. Then it sents the count value to the host computer through the single chip microcomputer serial port. It calculates and displays the value by the GUI of LabVIEW. The experimental results show that, the relative measurement error can be decreased to 1/10, i.e., the measurement accuracy can be improved by more than ten times.
© Owned by the authors, published by EDP Sciences, 2015
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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