Issue |
MATEC Web of Conferences
Volume 32, 2015
International Symposium of Optomechatronics Technology (ISOT 2015)
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Article Number | 05005 | |
Number of page(s) | 4 | |
Section | Progress in microscopy and imaging | |
DOI | https://doi.org/10.1051/matecconf/20153205005 | |
Published online | 02 December 2015 |
High Precision Stokes Polarimetry for Scattering Light using Wide Dynamic Range Intensity Detector
1 Center for Optical Research and Education, Utsunomiya University, 7-1-2 Yoto, Utsunomiya, Tochigi, Japan
2 Depertment of Optical Engineering, Utsunomiya University, 7-1-2 Yoto, Utsunomiya, Tochigi, Japan
a Corresponding author: shibata_s@opt.utsunomiya-u.ac.jp
This paper proposes a Stokes polarimetry for scattering light from a sample surface. To achieve a high accuracy measurement two approaches of an intensity detector and analysis algorism of a Stokes parameter were proposed. The dynamic range of this detector can achieve up to 1010 by combination of change of neutral-density (ND) filters having different density and photon counting units. Stokes parameters can be measured by dual rotating of a retarder and an analyzer. The algorism of dual rotating polarimeter can be calibrated small linear diattenuation and linear retardance error of the retarder. This system can measured Stokes parameters from −20° to 70° of its scattering angle. It is possible to measure Stokes parameters of scattering of dust and scratch of optical device with high precision. This paper shows accuracy of this system, checking the polarization change of scattering angle and influence of beam size.
© Owned by the authors, published by EDP Sciences, 2015
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