MATEC Web of Conferences

Prediction of electronic nanodevices technical status and reliability based on analysis of their performance parameters kinetics under the influence of external factors

Mstislav Makeev, Sergey Meshkov and Vladimir Sinyakin

MATEC Web Conf., 129 (2017) 03019

Published online: 07 November 2017

DOI: 10.1051/matecconf/201712903019

Mstislav Makeev

Sergey Meshkov

Vladimir Sinyakin

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