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Large scale foundation models for intelligent manufacturing applications: a survey
Haotian Zhang, Stuart Dereck Semujju, Zhicheng Wang, Xianwei Lv, Kang Xu, Liang Wu, Ye Jia, Jing Wu, Wensheng Liang, Ruiyan Zhuang, Zhuo Long, Ruijun Ma and Xiaoguang Ma Journal of Intelligent Manufacturing 37(1) 119 (2026) https://doi.org/10.1007/s10845-024-02536-7
Generative AI in industrial machine vision: a review
Hans Aoyang Zhou, Dominik Wolfschläger, Constantinos Florides, Jonas Werheid, Hannes Behnen, Jan-Henrik Woltersmann, Tiago C. Pinto, Marco Kemmerling, Anas Abdelrazeq and Robert H. Schmitt Journal of Intelligent Manufacturing (2025) https://doi.org/10.1007/s10845-025-02604-6
RA-UNet: A New Deep Learning Segmentation Method for Semiconductor Wafer Defect Analysis on Fine-Grained Scanning Electron Microscope (SEM) Images
Yibo Qiao, Yanning Chen, Fang Liu, Zhouzhouzhou Mei, Yuening Luo, Yining Chen, Yiyi Liao, Bo Wu and Yongfeng Deng IEEE Transactions on Semiconductor Manufacturing 38(2) 185 (2025) https://doi.org/10.1109/TSM.2025.3546296
Enhancing Energy Efficiency in Metallurgical Operations Using AI: A State of the Art Review
Real-time defect detection in 3D printing using machine learning
Mohammad Farhan Khan, Aftaab Alam, Mohammad Ateeb Siddiqui, Mohammad Saad Alam, Yasser Rafat, Nehal Salik and Ibrahim Al-Saidan Materials Today: Proceedings 42 521 (2021) https://doi.org/10.1016/j.matpr.2020.10.482
A more reliable defect detection and performance improvement method for panel inspection based on artificial intelligence