Study on Machine Learning Based Intelligent Defect Detection System
MATEC Web Conf., 201 (2018) 01010
Published online: 2018-09-14
Articles citing this article
The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
Cited article:
This article has been cited by the following article(s):
1 (2025)
https://doi.org/10.1007/978-3-030-48200-8_70-1
Generative AI in industrial machine vision: a review
Hans Aoyang Zhou, Dominik Wolfschläger, Constantinos Florides, Jonas Werheid, Hannes Behnen, Jan-Henrik Woltersmann, Tiago C. Pinto, Marco Kemmerling, Anas Abdelrazeq and Robert H. SchmittJournal of Intelligent Manufacturing (2025)
https://doi.org/10.1007/s10845-025-02604-6
Enhancing Energy Efficiency in Metallurgical Operations Using AI: A State of the Art Review
Swapnil S. Chaudhari, Minal Shahakar, Puja Gholap, Pramod B. Dhamdhere, Shital S. Agrawal, Rupesh Gangadhar Mahajan, Anant Sidhappa Kurhade and Shital Yashwant WawareJournal of Mines, Metals and Fuels 1595 (2025)
https://doi.org/10.18311/jmmf/2025/48703
853 (2025)
https://doi.org/10.1007/978-3-031-84477-5_70
RA-UNet: A New Deep Learning Segmentation Method for Semiconductor Wafer Defect Analysis on Fine-Grained Scanning Electron Microscope (SEM) Images
Yibo Qiao, Yanning Chen, Fang Liu, Zhouzhouzhou Mei, Yuening Luo, Yining Chen, Yiyi Liao, Bo Wu and Yongfeng DengIEEE Transactions on Semiconductor Manufacturing 38 (2) 185 (2025)
https://doi.org/10.1109/TSM.2025.3546296
Large scale foundation models for intelligent manufacturing applications: a survey
Haotian Zhang, Stuart Dereck Semujju, Zhicheng Wang, Xianwei Lv, Kang Xu, Liang Wu, Ye Jia, Jing Wu, Wensheng Liang, Ruiyan Zhuang, Zhuo Long, Ruijun Ma and Xiaoguang MaJournal of Intelligent Manufacturing (2025)
https://doi.org/10.1007/s10845-024-02536-7
01 (2024)
https://doi.org/10.1109/IPFA61654.2024.10691180
Detection and Classification of Surface Defects on Hot-Rolled Steel using Vision Transformers
Vinod Vasan, Naveen Venkatesh Sridharan, Sugumaran Vaithiyanathan and Mohammadreza AghaeiHeliyon e38498 (2024)
https://doi.org/10.1016/j.heliyon.2024.e38498
Intelligent Inspection for Evaluating Severity of Surface Defects in Investment Casting
Nabhan Yousef and Amit SataJournal of Advanced Manufacturing Systems 23 (01) 215 (2024)
https://doi.org/10.1142/S0219686724500094
Reinforcement learning-based approach for plastic texture surface defects inspection
Chao-Ching Ho, Yuan-Cheng Chiao and Eugene SuThe Visual Computer 40 (6) 4201 (2024)
https://doi.org/10.1007/s00371-023-03077-5
Research on Automatic Detection System of Drawing Defects based on Machine Vision
Yupeng Pan, Li Chen, Baogeng Xin and Yong liuRecent Patents on Engineering 18 (8) (2024)
https://doi.org/10.2174/1872212118666230914103818
Machine Vision—Moving from Industry 4.0 to Industry 5.0
Maria Tzampazaki, Charalampos Zografos, Eleni Vrochidou and George A. PapakostasApplied Sciences 14 (4) 1471 (2024)
https://doi.org/10.3390/app14041471
Hot rolled steel surface defect detection and classification using an automatic ensemble approach
Vinod Vasan, Naveen Venkatesh Sridharan, Vaithiyanathan Sugumaran and Rebecca Jeyavadhanam BalasundaramEngineering Research Express 6 (2) 025544 (2024)
https://doi.org/10.1088/2631-8695/ad4a26
1 (2024)
https://doi.org/10.1109/LAD62341.2024.10691707
105 (2023)
https://doi.org/10.1109/ICARSC58346.2023.10129634
1 (2023)
https://doi.org/10.1109/ICPS58381.2023.10128067
Real-time defect detection in 3D printing using machine learning
Mohammad Farhan Khan, Aftaab Alam, Mohammad Ateeb Siddiqui, Mohammad Saad Alam, Yasser Rafat, Nehal Salik and Ibrahim Al-SaidanMaterials Today: Proceedings 42 521 (2021)
https://doi.org/10.1016/j.matpr.2020.10.482
A more reliable defect detection and performance improvement method for panel inspection based on artificial intelligence
Eui-Young Jeong, Jaewon Kim, Won-Hyouk Jang, et al.Journal of Information Display 22 (3) 127 (2021)
https://doi.org/10.1080/15980316.2021.1876174
212 (2020)
https://doi.org/10.1109/SMART50582.2020.9336802
127 (2020)
https://doi.org/10.1109/ICITM48982.2020.9080396
1 (2020)
https://doi.org/10.1109/CSDE50874.2020.9411532
1 (2019)
https://doi.org/10.1109/ISCAS.2019.8702568