Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Impedance-Oriented Transient Instability Modeling of SiC mosfet Intruded by Measurement Probes

Zheng Zeng, Xin Zhang, Frede Blaabjerg and Linjing Miao
IEEE Transactions on Power Electronics 35 (2) 1866 (2020)
https://doi.org/10.1109/TPEL.2019.2922246