Open Access
Issue
MATEC Web Conf.
Volume 210, 2018
22nd International Conference on Circuits, Systems, Communications and Computers (CSCC 2018)
Article Number 02034
Number of page(s) 4
Section Systems
DOI https://doi.org/10.1051/matecconf/201821002034
Published online 05 October 2018
  1. P. Neumann, Odborný časopis pro vývoj a výrobu v oboru elektroniky (2011) [Google Scholar]
  2. M.M. Tehranipoor, U. Guin & D. Forte, Counterfeit Integrated Circuits (Springer, Cham., 2015) [Google Scholar]
  3. U. Guin, D. DiMase, M. Tehranipoor, J Electron Test (2014) [Google Scholar]
  4. H.W. Hewett, In SMTA Int. Conf. (2010) [Google Scholar]
  5. P. Neumann, J. Houser, M. Pospíšilík, P. Skočík, & M. Adámek, Proc. of DAAAM (2015) [Google Scholar]
  6. P. Neumann, Odborný časopis pro vývoj a výrobu v oboru elektroniky (2015) [Google Scholar]
  7. J.M. Chalmers, G.E. Howell, M.D. Hargreaves. Infrared and Raman spectroscopy in forensic science (Wiley, 2012) [CrossRef] [Google Scholar]
  8. G.S. Bumbrah, R.M. Sharma, Egypt J Forensic Sci 6, 3 (2016). [Google Scholar]
  9. H. Vaskova, MATEC Web Conf (2016) [Google Scholar]
  10. H. Vaskova, M. Buckova, MATEC Web Conf (2017) [Google Scholar]

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.