Open Access
| Issue |
MATEC Web Conf.
Volume 165, 2018
12th International Fatigue Congress (FATIGUE 2018)
|
|
|---|---|---|
| Article Number | 13009 | |
| Number of page(s) | 8 | |
| Section | Growth of Short and Long Cracks - Crack Growth Thresholds | |
| DOI | https://doi.org/10.1051/matecconf/201816513009 | |
| Published online | 25 May 2018 | |
- R.C. Alderliesten, How proper similitude can improve our understanding of crack closure and plasticity in fatigue, Int. J. of Fatigue, 82 263-273 (2016) [CrossRef] [Google Scholar]
- R.C. Alderliesten, How proper similitude could have improved our understanding about fatigue damage growth, Proc. 28th ICAF Sym, 47-57 (2015) [Google Scholar]
- E. Amsterdam, F. Grooteman, The influence of stress state on the exponent in the power law equation of fatigue crack growth, Int. J. of Fatigue, 82 572-578 (2016) [CrossRef] [Google Scholar]
- A.F. Grandt, J.A. Harter, D.E. Tritsch, Semielliptical cracks along holes in plates and lugs, AFWAL-TR-83-3043 (1983) [Google Scholar]
- J.R. Snow, A stress intensity factor calibration for corner flaws at an open hole, AFML-TR-74-282 (1975) [Google Scholar]
- J. Schijve, Fatigue of Structures and Materials (2009) [CrossRef] [Google Scholar]
- J.C. Newman, I.S. Raju, Prediction of fatigue crackgrowth patterns and lives in three-dimensional cracked bodies, Proc. 6th Int. Conf. on Fracture (ICF6), 1597-1608 (1984) [Google Scholar]
- T.M. Hsu, W.M. McGee, J.A. Aberson, Extended study of flaw growth at fastener holes, AFFDL-TR-70-149 (1978) [Google Scholar]
- M. Conen, Appendix B : Cellular Automator, unpublished work (2008) [Google Scholar]
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