Open Access
Issue
MATEC Web Conf.
Volume 75, 2016
2016 International Conference on Measurement Instrumentation and Electronics (ICMIE 2016)
Article Number 10005
Number of page(s) 5
Section The Technology of Electronic Circuit
DOI https://doi.org/10.1051/matecconf/20167510005
Published online 01 September 2016
  1. Y. S. Xia, K.Y. Mao, X.E. Ye, Journal of Computer-Aided Design & Computer Graphics, 19, 1522–1527(2007) [Google Scholar]
  2. L.Y. Wang, Y.S. Xia, X.X. Cheng, Journal of Computer-Aided Design & Computer Graphics, 24,961–967 (2012) [Google Scholar]
  3. M.H. Moaiyeri, R. F. Mirzaee, K. Navi, et al, International Journal of Electronics, 97, 647–662(2010) [CrossRef] [Google Scholar]
  4. S. Purohit, M. Margala, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 20, 1327–1331(2012) [CrossRef] [Google Scholar]
  5. S. Wairya, G. Singh, Vishant, et al, Proceedings of IEEE International Conference on Engineering, 1–7(2011) [Google Scholar]
  6. J.P. Hu, Z.L. Li, Y.S. Xia. Energy Education Science and Technology Part A: Energy Science and Research, 30, 85–92(2012) [Google Scholar]
  7. N. Zhuang, H.M. Wu. IEEE Journal of Solid-state Circuits, 27,840–844(1992) [CrossRef] [Google Scholar]
  8. S.S. Mishra, A.K. Agrawal, R.K. Nagaria. International Journal on Emerging Technologies, 1,1–10(2010) [Google Scholar]
  9. S. Nishizawa, T. Ishihara, H. Onodera. Proceedings of IEEE 14th International Symposium on Quality Electronic Design,703–708 (2013) [CrossRef] [Google Scholar]
  10. H. Liang, Y.S. Xia, L.B. Qian, et al, Journal of computer-Aided Design & Computer Graphics, 27, 940–945 (2015) [Google Scholar]

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.