Open Access
Issue
MATEC Web Conf.
Volume 75, 2016
2016 International Conference on Measurement Instrumentation and Electronics (ICMIE 2016)
Article Number 10003
Number of page(s) 4
Section The Technology of Electronic Circuit
DOI https://doi.org/10.1051/matecconf/20167510003
Published online 01 September 2016
  1. E. Cuignet, E. Tonello, J. Maynard, P. Boone, IVEC2013, 14th, Pag: 1–2(2013).
  2. A. Katz, R. Gray, R. Dorval, IEEE micro. Mag., J. 10, 7, pp. 20–27 (2009). [CrossRef]
  3. X. Feng, B. Feuvrie, A.S. Descamps, Y. Wang, Electr. Lett., J., 50, (24), pp. 1882–1884(2014). [CrossRef]
  4. A. Katz, R. Gray, R. Dorval, IEEE Trans. Electr. Dev., 56, 5, pp. 959–964 (2009). [CrossRef]
  5. A. Katz, R. Sudarsanam, C. Aubert, MTTS Int. Microw. Symp. Dig., pp. 661–664 (1985). [CrossRef]
  6. A. Katz, R. Domal, IEEE MTT-S Digest, pp. 437–440 (1994)
  7. H.Y. Jeong, S.K. Park, N.S. Ryu, Y.C. Jeong, EGAAS, pp. 597–600(2005).
  8. S.C . Bera, V. Kumar, S. Singh, D.K. Das, 23, 4, pp. 211–213(2013).
  9. A. A. M. Saleh, Tans. on Comm., 29, 11, pp. 1715–1720. (1981).

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.