Open Access
Issue
MATEC Web Conf.
Volume 75, 2016
2016 International Conference on Measurement Instrumentation and Electronics (ICMIE 2016)
Article Number 10003
Number of page(s) 4
Section The Technology of Electronic Circuit
DOI https://doi.org/10.1051/matecconf/20167510003
Published online 01 September 2016
  1. E. Cuignet, E. Tonello, J. Maynard, P. Boone, IVEC2013, 14th, Pag: 1–2(2013). [Google Scholar]
  2. A. Katz, R. Gray, R. Dorval, IEEE micro. Mag., J. 10, 7, pp. 20–27 (2009). [CrossRef] [Google Scholar]
  3. X. Feng, B. Feuvrie, A.S. Descamps, Y. Wang, Electr. Lett., J., 50, (24), pp. 1882–1884(2014). [CrossRef] [Google Scholar]
  4. A. Katz, R. Gray, R. Dorval, IEEE Trans. Electr. Dev., 56, 5, pp. 959–964 (2009). [CrossRef] [Google Scholar]
  5. A. Katz, R. Sudarsanam, C. Aubert, MTTS Int. Microw. Symp. Dig., pp. 661–664 (1985). [CrossRef] [Google Scholar]
  6. A. Katz, R. Domal, IEEE MTT-S Digest, pp. 437–440 (1994) [Google Scholar]
  7. H.Y. Jeong, S.K. Park, N.S. Ryu, Y.C. Jeong, EGAAS, pp. 597–600(2005). [Google Scholar]
  8. S.C . Bera, V. Kumar, S. Singh, D.K. Das, 23, 4, pp. 211–213(2013). [Google Scholar]
  9. A. A. M. Saleh, Tans. on Comm., 29, 11, pp. 1715–1720. (1981). [Google Scholar]

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