MATEC Web Conf.
Volume 336, 20212020 2nd International Conference on Computer Science Communication and Network Security (CSCNS2020)
|Number of page(s)||6|
|Section||Study of Advanced Materials and Performance Analysis|
|Published online||15 February 2021|
Research on the combination of improved Sobel operator and ant colony algorithm for defect detection
Shanghai Dianji University, Shanghai, China
* Corresponding author: firstname.lastname@example.org
There are many aspects in the defect detection system. Any deviation in any link will affect the accuracy of the final detection, and edge detection is very important in the image preprocessing stage. In this paper, a new edge detection algorithm is proposed. Firstly, the improved Sobel operator is used to detect the image contour, and then the position of the contour is taken as the initial position of ant colony algorithm. The experimental results show that the algorithm can extract the contour with uniform thickness and length from the original image collected by the industrial camera, and the running time of the algorithm is almost the same as that of the traditional ant colony algorithm, thus providing more accurate data for the defect detection of products in the later stage.
© The Authors, published by EDP Sciences, 2021
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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