| Issue |
MATEC Web Conf.
Volume 232, 2018
2018 2nd International Conference on Electronic Information Technology and Computer Engineering (EITCE 2018)
|
|
|---|---|---|
| Article Number | 04013 | |
| Number of page(s) | 4 | |
| Section | Circuit Simulation, Electric Modules and Displacement Sensor | |
| DOI | https://doi.org/10.1051/matecconf/201823204013 | |
| Published online | 19 November 2018 | |
VI Curve Test Based On Discrete Excitation Signals
1
Detection Technology and Automatic Equipment, Army Academy of Armored Forces, 100072 Beijing, China
2
Weapon Systems and Utilization Engineering, Army Academy of Armored Forces, 100072 Beijing, China
* Corresponding author: aXinchi Tang: 1315339080@qq.com
In-Circuit Test System is an instrument that uses the VI curve test to diagnose circuit faults. Generally, continuous signals such as sine wave, triangle wave and square wave are used as the VI curve test excitation source. There are some problems in the synchronization of the analysis. In this paper, we study a VI curve test based on discrete excitation signal, analyze the problems arising from continuous signal testing, and propose a continuous signal discretization circuit scheme. The feasibility and practicability of this method are proved by Matlab simulation and experiment.
© The Authors, published by EDP Sciences, 2018
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