| Issue |
MATEC Web of Conferences
Volume 59, 2016
2016 International Conference on Frontiers of Sensors Technologies (ICFST 2016)
|
|
|---|---|---|
| Article Number | 01005 | |
| Number of page(s) | 4 | |
| Section | Electronic engineering and sensing technology | |
| DOI | https://doi.org/10.1051/matecconf/20165901005 | |
| Published online | 24 May 2016 | |
Influence of the coupling between an atmospheric pressure ion mobility spectrometer and the low pressure ion inlet of a mass spectrometer on the mobility measurement
Physics Department, German University in Cairo, Cairo, Egypt
Ion mobility spectrometers (IMS) are versatile gas analyzers. Due to their small size and robustness, combined with a very high sensitivity, they are often used in gas sensing applications such as environmental monitoring. In order to improve the selectivity, they are typically combined with a mass spectrometer (MS). Since IMS works at atmospheric pressure, and MS works at vacuum, a special interface reducing the pressure over normally two stages has to be used. In this paper the influence of this coupling of different pressure areas on the IMS signal will be analyzed with help of finite elements method simulations.
© Owned by the authors, published by EDP Sciences, 2016
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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