MATEC Web of Conferences

Automatic Semiconductor Wafer Image Segmentation for Defect Detection Using Multilevel Thresholding

N.H. Saad, A.E. Ahmad, H.M. Saleh and A.F. Hasan

MATEC Web Conf., 78 (2016) 01103

Published online: 07 October 2016

DOI: 10.1051/matecconf/20167801103

N.H. Saad

A.E. Ahmad

H.M. Saleh

A.F. Hasan

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