MATEC Web of Conferences

Nondestructive testing method for a new generation of electronics

Anton Azin, Andrey Zhukov, Anton Narikovich, Sergey Ponomarev, Sergey Rikkonen and Vladimir Leitsin

MATEC Web Conf., 143 (2018) 04007

Published online: 08 January 2018

DOI: 10.1051/matecconf/201814304007

Anton Azin

Andrey Zhukov

Anton Narikovich

Sergey Ponomarev

Sergey Rikkonen

Vladimir Leitsin

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