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Identification of Size and Concentration of Submicron Particles on the Basis of Rayleigh Scattering Model

Ivan. S. Bondarchuk, Vladimir A. Arkhipov and Alexander S. Zhukov

MATEC Web Conf., 72 (2016) 01014

Published online: 09 August 2016

DOI: 10.1051/matecconf/20167201014

Ivan. S. Bondarchuk

Vladimir A. Arkhipov

Alexander S. Zhukov

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