Local Quasioptical Resonator Diagnostics of Semiconductor WafersIgor Dorofeev, Grigorii Dunaevskii, Alexander Badin, Kirill Dorozhkin, Vitaly Bessonov and Sergey KhodovitskiyMATEC Web Conf., 155 (2018) 01051DOI: https://doi.org/10.1051/matecconf/201815501051